Dielectric Characteristics of PVA/ZrO<sub>2</sub>–SiC Nanostructures for Electronics Applications
Nanosistemi, Nanomateriali, Nanotehnologii
Researchers on Platform
More by this author
Fabricating and controlling the morphological, microstructure and optical features of (CS-PVA-WC-SiO<sub>2</sub>) promising films for nanoelectronics devices and optical applications
Interfacial polarization in PMMA/SiC-NiO hybrid nanocomposites with enhanced dielectric and mechanical performance for flexible electronic applications
Fabrication and Enhanced Features for PVA-MC-SrTiO3-SiO2 New Nanostructures for Optical Devices and Electronics Applications
Enhancement of spectroscopic and dielectric behavior of poly-methyl methacrylate-polyvinylpyrrolidone-silicon oxide-tungsten oxide new hybrid films for advanced optoelectronics applications
Manufacturing and Controlling the Microstructural, Optical and Dielectric Features of PS-PEG/SiO2-Sb2O3 Promising Films for Pressure Sensors and Flexible Optoelectronics Applications